Honored for his transformative contributions to information and system science and his sustained mentoring and development of new generations of scientists.
The IEEE VIS Test of Time award recognizes articles published at previous conferences whose contents are still vibrant and useful today and have had a major impact and influence within and beyond the visualization community.
Among other virtues, silicon “rusts” in a way that insulates a chip's circuitry. Two new ultrathin materials share that trait and others vital to the future of electronics.
Their approach reveals features that are otherwise obscured by speckle noise when using conventional OCT or OCT with current state of the art speckle reduction methods.