High-Field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors
High-Field Breakdown and Thermal Characterization of Indium Tin Oxide Transistors
Summary
Research Article: Haotian Su, Yuan-Mau Lee, Tara Peña, Sydney Fultz-Waters, Jimin Kang, Çağıl Köroğlu, Sumaiya Wahid, Christina J. Newcomb, Young Suh Song, H.-S. Philip Wong, Shan X. Wang, and Eric Pop, 4/21/2025. https://doi.org/10.1021/acsnano.5c01572
Apr
2025
Published : Apr 27th, 2025 at 04:24 pm
Updated : Jul 18th, 2025 at 11:13 am