Abstract: Leading edge semiconductor companies are currently handling several TB of data per day and are only able to actively deal with a fraction of this data stream. There is a huge demand for systems to process the data as rapidly as possible to make quick diagnostic or wafer disposition decisions with minimum human intervention, and also to avoid storing these huge quantities of raw data. This requires comprehensive data analytics systems to cover the entire IC manufacturing supply chain from the front-end wafer manufacturing to the fully packaged systems.

In this seminar we will introduce an end-to-end analytics system called Exensio from PDF Solutions which is an industry leading AI platform built on the three main principles: Data Infrastructure & Semantic, GenAI Enabled Decision Making and Enterprise Scale Solutions. We will focus on the AI for Test & ModelOps and describe the data-centric system architecture for model training, model deployment, data feed forward and model monitoring. We will demonstrate the system implementation of the central site on cloud and also on the edge box, where Exensio serves as the container fab. We will show a number of real-life customer deployment examples for several use cases such as: Design/Test Optimization, Predictive Binning and Predictive Burn-in.

Bio: Andrzej J. Strojwas is Professor Emeritus of Electrical and Computer Engineering at Carnegie Mellon University. Since 1997, he has served as Chief Technologist at PDF Solutions. He has held positions at Harris Semiconductor Co., AT&T Bell Laboratories, Texas Instruments, NEC, HITACHI, SEMATECH and KLA-Tencor.

He received multiple awards for the best papers published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Semiconductor Manufacturing and IEEE-ACM Design Automation Conference. Dr. Strojwas is a recipient of the SRC Inventor Recognition Award. He was the Editor of the IEEE Transactions on CAD of ICAS from 1987 to 1989 and served as Technical Program Chairman of the 1988 ICCAD and Conference Chairman of the 1989 ICCAD. In 1990, he was elected IEEE Fellow.

Dr. Strojwas received a Master of Science degree in Electrical Engineering from the Technical University of Warsaw, Poland, and his Ph.D. from Carnegie Mellon University in Pittsburgh.