Fouad Tobagi awarded the 2024 ACM SIGMOBILE Outstanding Contribution Award
His citation reads, ‘for seminal development of Carrier Sense Multiple Access (CSMA) as a widely used fundamental mechanism for efficient wireless transmission.'
John Cioffi selected as Royal Society of Edinburgh Corresponding Fellow
He will be joining the 1,800 current Fellows of the RSE, Scotland’s National Academy.
Teresa Meng receives the 2024 Marconi Prize
For fundamental technical contributions to and commercial leadership in all-CMOS Wi-Fi technology, leading to its widespread use in practice.
Gordon Wetzstein receives IEEE VGTC VR Technical Achievement Award and Academy Induction
His citation reads, ‘for his pioneering research in the development of computational display and imaging devices.’
Chelsea Finn selected as AI2050 Early Career Fellow
Her project’s goal is to develop a framework that seeks out incorrect information and uses that interaction to robustify the model.
Ram Rajagopal is part of new research consortium to help optimize the future grid
With the support of the U.S. Department of Energy, a Stanford-led consortium of 22 research institutions seeks to help communities balance top priorities for a decarbonized grid.
Dan Boneh’s statement on the President’s National Cybersecurity Strategy
Leading technology companies, academics, and civil society organizations applauded the Biden-Harris Administration’s efforts and underscored the importance of software measurability and memory safety.
Priyanka Raina named 2024 Sloan Research Fellow
The fellowships honor early-career researchers whose creativity, innovation, and research accomplishments make them stand out as the next generation of leaders.
Dustin Schroeder’s research lab finds new data on potential thaw in Antarctica
The Wilkes Subglacial Basin in East Antarctica holds enough ice to raise global sea levels by more than 10 feet.
Howard Zebker elected to National Academy of Engineering (NAE)
His citation reads, ‘for developing radar interferometry for space-born sensors that measure meter-scale topography and millimeter-scale surface deformation.'