Congratulations to David H. Lin (PhD '16), Eshan Singh (PhD candidate), and Professor Subhasish Mitra for receiving the 2015 IEEE International Test Conference (ITC) Best Paper Award.
To encourage excellence in its technical program, ITC presents awards to authors of outstanding papers presented at ITC and published in the proceedings. In determining award-winning papers, the ITC Awards Selection Committee considers the quality of the papers as published in the Proceedings and as presented at the conference technical sessions. The committee's decisions are based on responses by conference attendees as recorded on session rating cards and on the observations and recommendations of the ITC Program Committee.
Their paper, "A Structured Approach to Post-Silicon Validation and Debug using Symbolic Quick Error Detection", has been selected as the Best Paper for International Test Conference (ITC).
The Best Paper Award will be presented to Mitra and co-authors during the plenary session at ITC on November 15th.
Congratulations to all!