Exploiting to see beyond the diffraction-limit of optical microscopies is of great significance. State-of-the-art solutions of super-resolution microscopy, like STED and STORM approaches, rely on the fluorescent effect of labeling samples. It is still challenging to obtain the super-resolution for unlabeling samples without fluorescent effect. To this end, we have developed a novel super-resolution method, called Spatial Frequency Shift (SFS), to realize the deep super-resolution with or without fluorescent effect in wide field imaging. The principle and the applications of this SFS technique will be presented.