This work presents the development of a quantum dot-based photosensitive film engineered to be integrated on standard CMOS process wafers. It enables the design of exceptionally high performance, reliable image sensors. Quantum dot solids absorb light much more rapidly than typical silicon-based photodiodes do, and with the ability to tune the effective material bandgap, quantum dot-based imagers enable higher quantum efficiency over extended spectral bands, both in the Visible and IR regions of the spectrum. Moreover, a quantum dot-based image sensor enables desirable functions such as ultra-small pixels with low crosstalk, high full well capacity, global shutter and wide dynamic range at a relatively low manufacturing cost. At InVisage, we have optimized the manufacturing process flow and are now able to produce high-end image sensors for both visible and NIR in quantity.
The Stanford Center for Image Systems Engineering (SCIEN) is a partnership between the Stanford School of Engineering and technology companies developing imaging systems for the enhancement of human communication.