This talk has been cancelled because EE380 requires a video of the presentation. The speakers talk includes unpublished ideas and results which can be disclosed to a small group but not to a large group over broadcast video.
Hopefully the talk will be rescheduled next week for a small live audience of specialists. Watch for an announcement if you are interested.
This presentation will highlight some of our recent research results in developing new diagnosis techniques as well as constructing new error correcting codes (ECC) well suited for emerging memory technologies. In particular, a fundamentally new approach for extracting diagnostic information from output response data highly compacted in multiple input signature registers (MISRs) will be described. This approach is based on symbolic canceling and can significantly increase the precision of error location information without requiring any additional hardware or data to be collected. Emerging memory technologies (e.g., phase change memories, spin transfer torque magnetic RAM, etc.) have new error mechanisms and higher error rates than traditional memories. New ECCs with more attractive decoding latency and complexity will be presented for addressing these reliability challenges.