Today's advanced CMOS technology nodes allow unprecedented performance and integration capabilities. However, the increased density also brings challenges in meeting power targets and dealing with variability in process and operating conditions. In this talk I will describe some of the sources of this variability, and demonstrate key circuit and architecture techniques that detect and adapt to variations to ensure reliability while maximizing energy efficiency.
Jim Tschanz is a circuits researcher at Intel Corporation in Hillsboro, Oregon and currently is Director of the Intel Circuit Research Lab. He received his B.S. degree in computer engineering and M.S. degree in electrical engineering from the University of Illinois at Urbana-Champaign, and since 1999 has performed research at Intel in the area of low power, variation tolerant, and resilient circuits. He also taught VLSI design for 7 years as an adjunct faculty member at the Oregon Graduate Institute in Beaverton, OR. He has published over 60 conference and journal papers, has authored 3 book chapters, and has 51 issued patents.