Seminar: Microwave Imaging Systems (MIS), opportunities and challenges

image of Dr. Sherif Ahmed
Topic: 
Microwave Imaging Systems (MIS), opportunities and challenges
Monday, August 12, 2019 - 11:00am
Venue: 
Allen 101
Speaker: 
Dr. Sherif Ahmed (Rohde & Schwarz)
Abstract / Description: 

Microwave Imaging Systems (MIS) have witnessed huge progress during the last few years; thanks to the advances in the semiconductor miniaturization, for both analogue as well as digital circuits. Notwithstanding the ever-increasing demands for imaging solutions serving in the industrial, security, and medical domains. Many efforts are accomplished to move microwave imaging methods from their conventional lab environment to the real applications space. Many more methods are still yet struggling to see the light away from the lab bench and the computer simulators. Collaboration between academia and industry is essential to advance microwave imaging in the benefit of the general public. Monitoring this over the years, it is obvious that educational and research gaps are hindering the progress of this challenging technology. This talk aims to be a first step to raise awareness on the topic and to envision a dedicated research focused initiative in academia.
Microwave imaging has proved to be of a great benefit to many applications and one can surely say that: we just scratched the surface!

Bio:

Dr. Ahmed is a Germany based entrepreneur, Academic and R&D expert. He has more than 10 years of professional industry experience, with more than 20 patent filings. Along the past years, he published 25+ research papers and a book on advanced microwave imaging methods. He was the recipient of the University Academic Award of the Technische Universität München (TUM) in 2007, the Innovation Award of Rohde & Schwarz (R&S) in 2009 and 2018, and last but not least, he received the IEEE MTT Microwave Prize Award in 2013. Moreover, Dr. Ahmed is a senior IEEE member and contributes as a reviewer on the IEEE Transactions on Terahertz Science and Technology, IEEE Transactions on Antennas and Propagation, as well as the SPIE conference on Millimetre Wave and Terahertz Sensors and Technology; where he also chair-ed several sessions. Additionally, he is a co-chair on the ANSI American Standard for Measuring the Imaging Performance of mmWave Systems for Security Screening of Humans.

Dr. Ahmed's R&D experience extends to: near-field microwave imaging, stand-off imaging, along with nondestructive testing, multistatic radar, advanced signal-processing techniques, terahertz technology, and last but not least, automotive radar design and characterization. In the past years, he pioneered the body scanner technology with the first fully-electronic multistatic imaging systems, which are being deployed worldwide today. In the recent years, he has been also working on redefining the qualifications of automotive radars, towards autonomous driving capabilities. During his scientific journey, he has managed strategic projects besides trial activities in both Europe and the US. Covering all-round experience from research explorations to product development and production, down to standardization and market introduction.