Exploiting to see beyond the diffraction-limit of optical microscopies is of great significance. State-of-the-art solutions of super-resolution microscopy, like STED and STORM approaches, rely on the fluorescent effect of labeling samples. It is still challenging to obtain the super-resolution for unlabeling samples without fluorescent effect. To this end, we have developed a novel super-resolution method, called Spatial Frequency Shift (SFS), to realize the deep super-resolution with or without fluorescent effect in wide field imaging. The principle and the applications of this SFS technique will be presented.
Professor Xu Liu is Yangtze River Scholarship Chair Professor in the College of Optical Science and Engineering of Zhejiang University, China. He had obtained his BS. and MS. Degrees from Zhejiang University, respectively. He obtained his Ph.D. from Ecole Nationale Superieure de Physique de Marseille in France in 1990. Then he joined the optics department as a faculty. His research fields include: Thin film optics and optical coating techniques, Projection and AR display, Optical imaging and instrumentation. He has authored more than 200 journal papers and 60 patents. Currently, he serves as the Director of State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, as well as the Secretary General of Chinese Optical Society. He is the fellow of OSA and SPIE.