CANCELLED - SPECIAL SEMINAR: Recent Advances in Diagnosis and Error Correcting Codes

Topic: 
CANCELLED -- a future date is being explored --
Wednesday, October 2, 2019 - 4:00pm
Venue: 
Gates 415
Speaker: 
Prof. Nur Touba (UT Austin)
Abstract / Description: 

Cancelled

This talk has been cancelled because EE380 requires a video of the presentation. The speakers talk includes unpublished ideas and results which can be disclosed to a small group but not to a large group over broadcast video.
Hopefully the talk will be rescheduled next week for a small live audience of specialists. Watch for an announcement if you are interested. 


 

This presentation will highlight some of our recent research results in developing new diagnosis techniques as well as constructing new error correcting codes (ECC) well suited for emerging memory technologies. In particular, a fundamentally new approach for extracting diagnostic information from output response data highly compacted in multiple input signature registers (MISRs) will be described. This approach is based on symbolic canceling and can significantly increase the precision of error location information without requiring any additional hardware or data to be collected. Emerging memory technologies (e.g., phase change memories, spin transfer torque magnetic RAM, etc.) have new error mechanisms and higher error rates than traditional memories. New ECCs with more attractive decoding latency and complexity will be presented for addressing these reliability challenges.

Bio:
Nur Touba is Professor of Electrical and Computer Engineering at the University of Texas at Austin. He did his undergraduate work at the University of Minnesota where he graduated Summa Cum Laude. He did his masters and Ph.D. at Stanford University where he worked with Prof. Edward McCluskey at the Center for Reliable Computing. He received a National Science Foundation (NSF) Early Faculty CAREER Award in 1997, College of Engineering Foundation Faculty Award in 2001, Best Paper Award at the VLSI Test Symposium in 2001, Best Panel Award at the International Test Conference in 2005, General Motors Faculty Fellowship in 2006, Best Paper Award at the International Symposium on Defect and Fault Tolerance in 2008 and 2018, and IEEE Fellow in 2009. His research interests are in VLSI testing and dependable computing.