News

John Hennessy and Philip Knight. Image credit: L.A. Cicero
Preparing leaders to address global challenges in the 21st century and beyond.
David Hallac, EE PhD candidate
For their paper titled, “Toeplitz Inverse Covariance-Based Clustering of Multivariate Time Series Data.”
Professor Lambertus 'Bert' Hesselink
The IEEE VIS Test of Time award recognizes articles published at previous conferences whose contents are still vibrant and useful today and have had a major impact and influence within and beyond the visualization community.

Events

Subscribe to Stanford Electrical Engineering EventsAdd to My Calendar