||G. A. Keeler, D. Agarwal, C. Debaes, B. E.
Nelson, N. C. Helman, H. Thienpont, and D. A. B. Miller, "Optical
pump-probe measurements of the latency of silicon CMOS optical
interconnects," IEEE Photonics Technol. Lett. 14, 1214-1216
We present the first measurements of
optical-electrical-optical conversion latency in a hybridly-integrated
optoelectronic/silicon complementary metal-oxide-semiconductor (CMOS)
chip designed for optical interconnection. Using an optical pump-probe
technique, we perform precise measurements with picosecond resolution
that closely match our simulations. Our findings suggest that optical
interconnects have the potential to provide equal or lower latency
than on-chip global wires in future CMOS microelectronics.
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